Surface chemical composition obtained from XPS survey spectra and WCA of dECMf surface before and after plasma treatment
| Sample | C (%) | O (%) | N (%) | N/C | O/C | WCA (°) |
|---|---|---|---|---|---|---|
| dECMfs | 74.3 ± 0.7 | 15.5 ± 0.8 | 7.8 ± 0.6 | 0.11 ± 0.01 | 0.21 ± 0.01 | 92.4 ± 1.5 |
| dECMf* | 64.5 ± 1.9 | 20.3 ± 1.1 | 13.07 ± 1.1 | 0.20 ± 0.02 | 0.31 ± 0.03 | 86.1 ± 0.5 |
A statistically significant variation in the relative surface concentration of C (P = 0.0108), O (P = 0.0111) and N (P = 0.0225) was observed. The WCA showed a significant decrease after plasma treatment (P < 0.0001). Statistical analysis: unpaired t test with Welch correction